车规标准AEC-Q200REV-C(5)

D Destructive test, devices are not to be reused for qualification or production. G Generic data allowed. See Section 2.3.

H Required for hermetic packaged devices only.

L Required for leaded devices only. N Nondestructive test, devices can be used to populate other tests or they can be used for production. S Required for surface mount devices only. Note:

车规被动元器件标准!

AEC-Q200-REV C June 17, 2005Automotive Electronics CouncilComponent Technical Committee

Page 14 of 111

车规被动元器件标准!

TABLE 2 - TABLE OF METHODS REFERENCED

TANTALUM & CERAMIC CAPACITORS

Stress NO. Reference Additional Requirements Pre- and Post-1 User Spec. Test is performed except as specified in the

Stress Electrical applicable stress reference and the additional Test requirements in Table 2. TEST NOT USED 2 ------------ ----------------------------------------------------------------- High Temperature 3 MIL-STD-Unpowered Exposure 202 Method 1000 hours @ T=150°C (Ceramics). (Storage) 108 1000 hours @ T=125°C (Tantalums).

Measurement at 24±2 hours after test conclusion.

Temperature 4 JESD22 1000 Cycles (-55°C to +125°C) Cycling Method Measurement at 24±2 hours after test conclusion.

JA-104

Destructive 5 EIA-469 10ea X 3 lots Note: Only applies to SMD Physical Analysis Ceramics. Electrical Test not required. Moisture 6 MIL-STD-t = 24 hours/cycle. Note: Steps 7a & 7b not Resistance 202 required. Unpowered.

Method 106 Measurement at 24±2 hours after test conclusion.

Biased Humidity 7 MIL-STD-1000 hours 85°C/85% RH. Note: Ceramics only -

202 Method Specified conditions: Rated Voltage and 1.3 to 1.5

103 volts. Add 100Kohm resistor. Tantalums - Rated

Voltage Only. Measurement at 24±2 hours after test conclusion.

Operational Life 8 MIL-STD-Condition D Steady State TA=125°C.

202 2/3 rated for Tantalum caps Method 108 Full rated for Ceramic caps

Measurement at 24±2 hours after test conclusion.

External Visual 9 MIL-STD-Inspect device construction, marking and

883 Method workmanship. Electrical Test not required

2009

Physical 10 JESD22 Verify physical dimensions to the applicable device Dimension Method specification. Note: User(s) and Suppliers spec.

JB-100 Electrical Test not required.

Terminal Strength 11 MIL-STD-Test leaded device lead integrity only. Conditions: (Leaded) 202 Method Ceramics: A (454 g), C (227 g), E (1.45 kg-mm).

211 Tantalums: A (2.27 kg), C (227 g), E (1.45 kg-mm).

Resistance to 12 MIL-STD-Note: Add Aqueous wash chemical - OKEM Clean Solvents 202 Method or equivalent. Do not use banned solvents.

215

Mechanical Shock 13 MIL-STD-Figure 1 of Method 213 SMD: Condition F

202 LEADED: Condition C Method 213

Vibration 14 MIL-STD-5 g's for 20 min., 12 cycles each of 3 orientations

202 Method Note: Use 8"X5" PCB .031" thick 7 secure points

204 on one long side and 2 secure points at corners of

opposite sides. Parts mounted within 2" from any

车规被动元器件标准!

Stress

TABLE 2 - TABLE OF METHODS REFERENCED

TANTALUM & CERAMIC CAPACITORS NO. Reference Additional Requirements

secure point. Test from 10-2000 Hz.