车规标准AEC-Q200REV-C

车规被动元器件标准!

AEC-Q200-REV C June 17, 2005

STRESS TEST QUALIFICATION

FOR

PASSIVE COMPONENTS

车规被动元器件标准!

AEC-Q200-REV C June 17, 2005

Automotive Electronics Council

Component Technical Committee

车规被动元器件标准!

AEC-Q200-REV C June 17, 2005

Automotive Electronics Council

Component Technical Committee

Table of Contents

Section Page

1.0 Scope 1 1.1 Description 1 1.1.1 Definition of Stress – Test Qualification 1 1.1.2 Approval for Use in an Application 2 1.2 Reference Documents 2 2.0 General Requirements 2-5 3.0 Qualification and Requalification 5-7 4.0 Qualification Tests 7-10 Table 1 – Qualification Sample Size Requirements Table 2 – Table of Methods Referenced Tantalum and Ceramic Table 2A – ceramic/Tantalum Process Change Qualification guidelines for the Selected Test Table 3 - Table of Methods Referenced Aluminum Electrolytic Capacitors 16-17 Table 3A – Electrolytic Capacitor Process Change Qualification Guidelines for the Selected Test Table 4 – Table Methods Referenced Film Capacitors Table 4A – Film Capacitor Process Change Qualification Guidelines for the Selection of Test Table 5 – Table of Methods Referenced Magnetics (Inductors/Transformers) Table 5A – Inductive Products Process Change Qualification Guidelines for the selection of Test Table 6 – Table of Methods Referenced Networks (R-C/C/R) Table 6A/7A – Networks and Resistors Process Change Qualification Guidelines for Selection of Test Table 7- Table of Methods Reference Resistors 28-29 Table 8 – Table of Methods Referenced Thermistors Table 8A – Thermistor Process Change Qualification Guideline for the Selection of Test Table 9 – Table of Methods Referenced Trimmer Capacitors/Resistors Table 9A – Trimmers Capacitors/Resistors Process Change Qualification Guidelines for the Selection of Test Table 10 Table of Methods Referenced Varistors 36-37 Table 10A – Varistors Process Change Qualification Guidelines for the Selection of Test Table 11 – Table of Methods Referenced Quartz Crystals Table 11A – Quartz Crystal Process change Qualification guidelines for the Selection of Test Table 12 – Table of Methods Referenced Ceramic Resonators Table 12A – Ceramic Resonator Process Change Qualification Guidelines for the Selection of Test Table 13 – Table of Methods Referenced Ferrite EMI Suppressors/Filters 45-46 Table 13A – Ferrite EMI Suppressors/Filters Process Change Qualification /Guideline for the Selection of Test Table 14 – Table of Methods Referenced Polymeric Resettable Fuses Table 14A – Polymeric Resettable Fuses Process Change Qualification /Guideline for the Selection of Test Glossary of Terms/Abbreviations 51 Appendix 1 – Definition of a Qualification Family 52-54 Appendix 2 – Certificate of Design, Construction and Qualification (CDCQ) Appendix 3 – Qualification Test Plan Format - Example Appendix 4 – Data Presentation Format and Content - Example Production Part Approval – Parametric Verification Summary – Example Revision History Attachment 1 AEC – Q200-001 Flame Retardance Attachment 2 AEC – Q200-002 Human Body Model Electrostatic Discharge Test Attachment 3 AEC – Q200-003 Beam Load (Break Strength) Test Attachment 4 AEC – Q200-004 Resettable Fuse Test

11-12 13-14 15 18 19-20 21 22-23 24 25-26 27 30-31 32 33-34 35 38 39-40 41 42-43 44 47 48-49 50 55 56-57 58 59 60

车规被动元器件标准!

Automotive Electronics Council

Component Technical Committee

AEC-Q200-REV C June 17, 2005

STRESS TEST QUALIFICATION

FOR PASSIVE ELECTRICAL DEVICES

1.0 1.1

SCOPE Description

This specification defines the minimum stress test driven qualification requirements and references test conditions for qualification of passive electrical devices. This document does not relieve the supplier of their responsibility to meet their own company's internal qualification program. In this document, "user" is defined as all companies that adhere to this document. The user is responsible to confirm and validate all qualification and assessment data that substantiates conformance to this document.

Definition of Stress-Test Qualification

Stress-Test “Qualification” is defined as successful completion of test requirements outlined in this document and any applicable supplements and compliance to any applicable user packaging specification. The minimum temperature range required for each passive electrical component type is listed below (maximum capability) as well as example applications typical of each grade (application specific):

GRADE

TEMPERATURE RANGE 1.1.1

0 1

PASSIVE COMPONENT TYPE

Maximum capability

Flat chip ceramic resistors, X8R ceramic capacitors

Capacitor Networks, Resistors, Inductors, Transformers, Thermistors, Resonators, Crystals and Varistors, all other ceramic and tantalum capacitors

Aluminum Electrolytic capacitors

TYPICAL/EXAMPLE APPLICATION All automotive Most underhood

-50°°C -40°°C

2 3 4

-40°°C -40°°C 0°°C

Passenger

compartment hot spots

Film capacitors, Ferrites, R/R-C Networks Most passenger and Trimmer capacitors compartment

Qualification of the noted device type to it's minimum temperature grade allows the supplier to claim the part as "AEC qualified" to that grade and all lesser grades. Qualification to temperatures less tha …… 此处隐藏：5074字，全部文档内容请下载后查看。喜欢就下载吧 ……