车规标准AEC-Q200REV-C(2)

For the device to be considered a qualified part, the purchase order and/or individual device specification cannot waive or detract from the requirements of this document.

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2.3

The Use of Generic Data to Satisfy Qualification and Requalification Requirements The use of generic data for qualification will be based on a matrix of specific requirements associated with each characteristic of the device and manufacturing process as shown in Tables 2-14 and Appendix 1.

Tables 2A-14A define a set of qualification tests that must be considered for any changes proposed for the component. Tables 2A-14A matrix is the same for both new processes and requalification associated with a process change. This table is a superset of tests that the supplier and user should use as a baseline for discussion of tests that are required for the qualification in question. All items in Tables 2-14 are tests that are required during component qualification and must be considered during the development of a component qualification plan. It is the supplier's responsibility to present rationale for why any of these tests need not be performed.

Appendix 1 defines the criteria by which components are grouped into a qualification family for the purpose of considering the data from all family members to be equal and generically acceptable to the qualification of the device in question.

With proper attention to these qualification family guidelines, information applicable to other devices in the family can be accumulated. This information can be used to demonstrate generic reliability of a device family and minimize the need for device-specific qualification test programs. This can be achieved through qualification of a range of devices representing the “four corners” of the qualification family (e.g. highest/lowest voltage, high/mid/low value). Sources of generic data shall come from certified test labs, and can include internal supplier's qualifications, user-specific qualifications and supplier's in-process monitors. The generic data to be submitted must meet or exceed the test conditions specified in Tables 2-14. End-point test temperature must address worst-case temperature extremes and designed product life for the applications. The user(s) will be the final authority on the acceptance of generic data in lieu of specific device test data (to include temperature ranges of the devices.)

2.3.1

Wearout Reliability Tests (End of Life Testing)

Testing for the failure mechanisms specific to each component technology should be available to the user whenever a new technology or material relevant to the appropriate wearout failure mechanism is to be qualified. The data, test method, calculations, and internal criteria need not be demonstrated or performed on the qualification of every new device, but should be available to the user upon request.

Note: This information may be subject to a confidentiality agreement, since it contains proprietary information of the supplier.

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2.4 Test Samples

2.4.1 Lot Requirements

Lot requirements are designated in Table 1, herein.

2.4.2 Production Requirements

All qualification parts shall be produced on tooling and processes at the manufacturing site that will be used to support part deliveries at projected production volumes.

2.4.3 Reusability of Test Samples

Devices used for nondestructive qualification tests may be used to populate other qualification tests. Devices that have been used for destructive qualification tests may not be used any further except for engineering analysis.

2.4.4 Sample Size Requirements

Sample sizes used for qualification testing and/or generic data submission must be consistent with the specified minimum sample sizes and acceptance criteria in Table 1. If the supplier elects to submit generic data for qualification, the specific test conditions and results must be reported. Existing applicable generic data shall first be used to satisfy these requirements and those of Section 2.3 for each test required in Table 1. Such generic data shall not be more than 2 years old. Part specific qualification testing shall be performed if the generic data does not satisfy these requirements.

2.4.5 Pre and Post Stress Test Requirements

All endpoint test temperatures (room, hot and cold) are specified in the "Additional Requirements" column Tables 2-13 for each test. The specific value of temperature must address the temperature extremes and designed product life for the application for at least one lot of data (generic or part specific) submitted per test. For example, if the supplier designs a device intended solely for use in a Grade 3 environment (e.g. -40°C to +85°C), his endpoint test temperature extremes need only address those application limits. Qualification to applications in higher-grade environments (e.g. -40°C to +125°C for Grade 1) will require testing of at least one lot using these additional endpoint test temperature extremes. All endpoint test conditions must include all user specifications for any given family.

2.5 Definition of Test Failure After Stressing

Test failures are defined as those devices not meeting the individual device specification, post-test criteria specific to the test or the supplier's data sheet in order of significance as defined in Section 2.2. Any device that shows external physical damage attributable to the environmental test is also considered a failed device. If the cause of failure is agreed (by the manufacturer and the user) to be due to mishandling or ESD, the failure shall be discounted, but reported as part of the data submission.

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2.6

Criteria for Passing Qualification

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